OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 6 — Feb. 20, 2003
  • pp: 1082–1090

Method for High-Accuracy Reflectance Measurements in the 2.5-µm Region

Rudolf Richter and Andreas Müller  »View Author Affiliations


Applied Optics, Vol. 42, Issue 6, pp. 1082-1090 (2003)
http://dx.doi.org/10.1364/AO.42.001082


View Full Text Article

Acrobat PDF (246 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Reflectance measurements with spectroradiometers in the solar wavelength region (0.4–2.5 μm) are frequently conducted in the laboratory or in the field to characterize surface materials of artificial and natural targets. The spectral surface reflectance is calculated as the ratio of the signals obtained over the target surface and a reference panel, yielding a relative reflectance value. If the reflectance of the reference panel is known, the absolute target reflectance can be computed. This standard measurement technique assumes that the signal at the radiometer is due completely to reflected target and reference radiation. However, for field measurements in the 2.4–2.5-μm region with the Sun as the illumination source, the emitted thermal radiation is not a negligible part of the signal even at ambient temperatures, because the atmospheric transmittance, and thus the solar illumination level, is small in the atmospheric absorption regions. A new method is proposed that calculates reflectance values in the 2.4–2.5-μm region while it accounts for the reference panel reflectance and the emitted radiation. This technique needs instruments with noise-equivalent radiances of 2 orders of magnitude below currently commercially available instruments and requires measurement of the surface temperatures of target and reference. If the reference panel reflectance and temperature effects are neglected, the standard method yields reflectance errors up to 0.08 and 0.15 units for 7- and 2-nm bandwidth instruments, respectively. For the new method the corresponding errors can be reduced to approximately 0.01 units for the surface temperature range of 20–35 °C.

© 2003 Optical Society of America

OCIS Codes
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.6780) Instrumentation, measurement, and metrology : Temperature
(120.6810) Instrumentation, measurement, and metrology : Thermal effects
(280.0280) Remote sensing and sensors : Remote sensing and sensors

Citation
Rudolf Richter and Andreas Müller, "Method for High-Accuracy Reflectance Measurements in the 2.5-µm Region," Appl. Opt. 42, 1082-1090 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-6-1082


Sort:  Author  |  Year  |  Journal  |  Reset

References

  1. F. A. Kruse, “Use of Airborne Imaging Spectrometer data to map minerals associated with hydrothermally altered rocks in the northern Grapevine Mountains, Nevada and California,” Remote Sens. Environ. 24, 31–51 (1988).
  2. F. A. Kruse, A. B. Lefkoff, and J. B. Dietz, “Expert system-based mineral mapping in northern Death Valley, California/Nevada, using the Airborne Visible/Infrared Imaging Spectrometer (AVIRIS),” Remote Sens. Environ. 44, 309–336 (1993).
  3. P. N. Slater, S. F. Biggar, R. G. Holm, R. D. Jackson, Y. Mao, M. S. Moran, J. M. Palmer, and B. Yuan, “Reflectance and radiance-based methods for the in-flight absolute calibration of multispectral sensors,” Remote Sens. Environ. 22, 11–37 (1987).
  4. R. Richter, “On the in-flight absolute calibration of high spatial resolution spaceborne sensors using small ground targets,” Int. J. Remote Sens. 18, 2827–2833 (1997).
  5. R. Richter and A. Müller, “Vicarious calibration of imaging spectrometers in the reflective region,” ESA SP-499 (European Space Agency, Noordwijk, The Netherlands, 2001), pp. 111–115.
  6. C. I. Grove, S. J. Hook, and E. D. Paylor, “Laboratory reflectance spectra for 160 minerals 0.4–2.5 μm,” JPL publication 92–2 (Jet Propulsion Laboratory, Pasadena, Calif., 1992).
  7. A. Berk, L. S. Bernstein, G. P. Anderson, P. K. Acharya, D. C. Bobertson, J. H. Chetwynd, and S. M. Adler-Golden, “MOD TRAN cloud and multiple scattering upgrades with application to AVIRIS,” Remote Sens. Environ. 65, 367–375 (1998).
  8. M. J. Duggin and T. Cunia, “Ground reflectance measurement techniques: a comparison,” Appl. Opt. 22, 3771–3777 (1983).
  9. P. N. Slater, “Radiometric considerations in remote sensing,” Proc. IEEE 73, 997–1011 (1985).
  10. V. R. Weidner, J. J. Hsia, and B. Adams, “Laboratory intercomparison study of pressed polytetrafluoroethylene powder reflectance standards,” Appl. Opt. 24, 2225–2230 (1985).
  11. P. R. Spyak and C. Lansard, “Reflectance properties of pressed Algoflon F6: a replacement reflectance-standard material for Halon,” Appl. Opt. 36, 2963–2970 (1997).
  12. K. Stamnes, S. C. Tsay, W. Wiscombe, and K. Jayaweera, “Numerically stable algorithm for discrete-ordinate-method radiative transfer in multiple scattering and emitting layered media,” Appl. Opt. 27, 2502–2509 (1988).
  13. Guide to Reflectance Coatings and Materials (Labsphere, Inc., North Sutton, N.H., 2002), www.labsphere.com.
  14. V. R. Weidner and J. J. Hsia, “Reflection properties of pressed polytetrafluoroethylene powder,” J. Opt. Soc. Am. 71, 856–861 (1981).
  15. M. E. Schaepman and S. Dangel, “Solid laboratory calibration of a nonimaging spectroradiometer,” Appl. Opt. 39, 3754–3764 (2000).
  16. Geophysical Environmental Research Corp., 16 Bennett Common, Millbrook, N.Y. 12545; http://www.ger.com/.
  17. D. Hatchell, ed., ASD Technical Guide, 3rd ed. (Analytical Spectral Devices, Inc., 5335 Sterling Drive, Boulder, Colo., 1999), p. 19–1.
  18. Analytical Spectral Devices, http://www.asdi.com/.
  19. W. L. Wolfe and G. J. Zissis, eds., The Infrared Handbook (U.S. Office of Naval Research, Washington, D.C., 1985).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited