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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 7 — Mar. 1, 2003
  • pp: 1182–1190

Measurement method for profiling the residual stress of an optical fiber: detailed analysis of off-focusing and beam-deflection effects

Yongwoo Park, Sangsoo Choi, Un-Chul Paek, Kyunghwan Oh, and Dug Young Kim  »View Author Affiliations


Applied Optics, Vol. 42, Issue 7, pp. 1182-1190 (2003)
http://dx.doi.org/10.1364/AO.42.001182


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Abstract

The effects of off-focusing and beam deflection on polarimetric stress measurements of optical fibers are investigated. A simple method for reducing the distortion of the phase retardation caused by unwanted beam deflections in residual stress measurement is introduced. The method is examined numerically by ray-tracing techniques and experimentally by use of hollow silica fibers into which various index-matching liquids have been inserted. An autofocusing technique is introduced. The error in stress measurement reproducibility was determined to be less than 4%. We tested the absolute error in measured stress by applying incremental external tension and determined that it is less than 0.464 MPa.

© 2003 Optical Society of America

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(060.2300) Fiber optics and optical communications : Fiber measurements
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5410) Instrumentation, measurement, and metrology : Polarimetry

History
Original Manuscript: June 19, 2002
Published: March 1, 2003

Citation
Yongwoo Park, Sangsoo Choi, Un-Chul Paek, Kyunghwan Oh, and Dug Young Kim, "Measurement method for profiling the residual stress of an optical fiber: detailed analysis of off-focusing and beam-deflection effects," Appl. Opt. 42, 1182-1190 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-7-1182

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