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Applied Optics

Applied Optics


  • Vol. 42, Iss. 8 — Mar. 10, 2003
  • pp: 1515–1519

Biased micromechanical cantilever arrays as optical image memory

Daniela Dragoman and Mircea Dragoman  »View Author Affiliations

Applied Optics, Vol. 42, Issue 8, pp. 1515-1519 (2003)

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We show that an array of optically actuated biased cantilevers can work as an optical data storage, able to encode data stored as arrays of optical pixels (images). Each of these optical pixels can, in addition, have a predetermined pixel depth, expressed as a certain number of gray levels. This new optical memory is able to work at a data rate of approximately 7 GB/s for an image with 128 × 128 pixels.

© 2003 Optical Society of America

OCIS Codes
(210.0210) Optical data storage : Optical data storage
(210.4680) Optical data storage : Optical memories
(230.0230) Optical devices : Optical devices
(230.0250) Optical devices : Optoelectronics
(230.3990) Optical devices : Micro-optical devices

Original Manuscript: July 1, 2002
Revised Manuscript: December 2, 2002
Published: March 10, 2003

Daniela Dragoman and Mircea Dragoman, "Biased micromechanical cantilever arrays as optical image memory," Appl. Opt. 42, 1515-1519 (2003)

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  1. M. Mansuripur, G. G. Sincerbox, “Principles and techniques of optical data storage,” Proc. IEEE 85, 1780–1796 (1997). [CrossRef]
  2. D. Dragoman, M. Dragoman, “Micro/Nano-Optoelectromechanical systems,” Prog. Quantum Electron. 25, 229–229 (2001). [CrossRef]
  3. L. R. Carley, J. A. Bain, G. K. Fedder, D. W. Greve, D. F. Guillou, M. S. C. Lu, T. Kukherjee, S. Santhanam, L. Abelmann, S. Min, “Single-chip computers with microelectromechanical systems-based magnetic memory,” J. Appl. Phys. 87, 6680–6685 (2000). [CrossRef]
  4. M. E. J. Friese, H. Rubinsztein-Dunlop, P. Hagberg, D. Hanstorp, “Optically driven micromachine elements,” Appl. Phys. Lett. 78, 547–549 (2001). [CrossRef]
  5. T. D. Stowe, K. Yasumura, T. W. Kenny, D. Botkin, K. Wago, D. Rugar, “Attonewton force detection using ultrathin silicon cantilevers,” Appl. Phys. Lett. 71, 288–290 (1997). [CrossRef]
  6. D. Dragoman, M. Dragoman, “Optical actuation of micromechanical tunneling structures with applications in spectrum analysis and optical computing,” Appl. Opt. 38, 6773–6778 (1999). [CrossRef]
  7. D. Dragoman, M. Dragoman, “Single device for laser source measurements from the ultraviolet to the far infrared,” Appl. Opt. 39, 4361–4365 (2000). [CrossRef]
  8. D. Dragoman, M. Dragoman, “Characterization of wave fronts of light beams by use of tunneling cantilevers,” Appl. Opt. 40, 678–682 (2001). [CrossRef]
  9. T. Yang, T. Ono, M. Esashi, “Surface effects and high quality factors in ultrathin single-crystal silicon cantilevers,” Appl. Phys. Lett. 77, 3860–3862 (2000). [CrossRef]
  10. K. E. Petersen, “Dynamic micromechanics on silicon: techniques and devices,” IEEE Trans. Electron. Devices 25, 1241–1250 (1978). [CrossRef]
  11. S. Quabis, R. Dorn, M. Eberler, O. Glöckl, G. Leuchs, “Focusing light to a tighter spot,” Opt. Commun. 179, 1–7 (2000). [CrossRef]
  12. H. Kawakatsu, D. Saya, A. Kato, K. Fukushima, H. Toshiyoshi, H. Fujita, “Millions of cantilevers for atomic force microscopy,” Rev. Sci. Instrum. 73, 1188–1192 (2002). [CrossRef]
  13. O. Marti, A. Ruf, M. Hipp, H. Bielefeldt, J. Colchero, J. Myynek, “Micromechanical and thermal effects on force microscope cantilevers,” Ultramicroscopy 345, 42–44 (1992).
  14. M. A. Mignardi, R. O. Gale, D. J. Dawson, J. C. Smith, in MEMS and MOEMS Technology and Applications, P. Rai-Choudhury, ed. (SPIE Press, Bellingham, Wash., 2000) pp. 169–208.
  15. D. Dragoman, M. Dragoman, “Time-frequency modeling of atomic force microscopy,” Opt. Commun. 140, 220–225 (1997). [CrossRef]
  16. S. Akamine, H. Kuwano, H. Yamada, “Scanning near-field optical microscope using an atomic force microscope cantilever with integrated photodiode,” Appl. Phys. Lett. 68, 579–581 (1996). [CrossRef]

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