Chromium-Doped Forsterite: Dispersion Measurement with White-Light Interferometry
Applied Optics, Vol. 42, Issue 9, pp. 1661-1666 (2003)
http://dx.doi.org/10.1364/AO.42.001661
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Abstract
Using a Michelson white-light interferometer, we measure the group-delay dispersion and third-order dispersion coefficients, d2φ/dω2 and d3φ/dω3, of chromium-doped forsterite (Cr:Mg2SiO4) over wavelengths of 1050–1600 nm for light polarized along both the c and b crystal axes. In this interval, the second-order dispersion for the c axis ranges from 35 fs2/mm to −14 fs2/mm, and the third-order dispersion ranges from 36 fs3/mm to 142 fs3/mm. For the b axis the second-order dispersion ranges from 35 fs2/mm to −15 fs2/mm and the third-order from 73 fs3/mm to 185 fs3/mm. Our data are relevant for the development of optimized dispersion compensation tools for Cr:Mg2SiO4 femtosecond lasers. These measurements help to clarify previously published results and show some significant discrepancies that existed, especially in the third-order dispersion. Our results should furthermore be useful to build up an analytic expression for the index of refraction of chromium forsterite.
© 2003 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(140.4050) Lasers and laser optics : Mode-locked lasers
(160.3380) Materials : Laser materials
(160.4760) Materials : Optical properties
(320.0320) Ultrafast optics : Ultrafast optics
(320.7160) Ultrafast optics : Ultrafast technology
Citation
Isabell Thomann, Leo Hollberg, Scott A. Diddams, and Randy Equall, "Chromium-Doped Forsterite: Dispersion Measurement with White-Light Interferometry," Appl. Opt. 42, 1661-1666 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-9-1661
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