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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 10 — Apr. 1, 2004
  • pp: 1991–1995

Improved Axial Position Detection in Optical Tweezers Measurements

Jakob Kisbye Dreyer, Kirstine Berg-Sørensen, and Lene Oddershede  »View Author Affiliations


Applied Optics, Vol. 43, Issue 10, pp. 1991-1995 (2004)
http://dx.doi.org/10.1364/AO.43.001991


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Abstract

We investigate the axial position detection of a trapped microsphere in an optical trap by using a quadrant photodiode. By replacing the photodiode with a CCD camera, we obtain detailed information on the light scattered by the microsphere. The correlation of the interference pattern with the axial position displays complex behavior with regions of positive and negative interference. By analyzing the scattered light intensity as a function of the axial position of the trapped sphere, we propose a simple method to increase the sensitivity and control the linear range of axial position detection.

© 2004 Optical Society of America

OCIS Codes
(040.1880) Detectors : Detection
(040.5160) Detectors : Photodetectors
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(140.7010) Lasers and laser optics : Laser trapping

Citation
Jakob Kisbye Dreyer, Kirstine Berg-Sørensen, and Lene Oddershede, "Improved Axial Position Detection in Optical Tweezers Measurements," Appl. Opt. 43, 1991-1995 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-10-1991


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References

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