OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 10 — Apr. 1, 2004
  • pp: 2013–2022

Simultaneous absolute measurements of principal angle and phase retardation with a new common-path heterodyne interferometer

Yu-Lung Lo, Chun-Hau Lai, Jing-Fung Lin, and Ping-Feng Hsu  »View Author Affiliations


Applied Optics, Vol. 43, Issue 10, pp. 2013-2022 (2004)
http://dx.doi.org/10.1364/AO.43.002013


View Full Text Article

Enhanced HTML    Acrobat PDF (278 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

This study demonstrates a new method for simultaneously measuring both the angle of the principal axis and the phase retardation of the linear birefringence in optical materials. We used a circular common-path interferometer (polariscope) as the basic structure modulated by an electro-optic (EO) modulator. An algorithm was developed to simultaneously measure the principal axis and the phase retardation of a λ/4 or λ/8 plate as a sample. In the case of a λ/4 plate, the average absolute error of the principal axis is approximately 3.77°, and that of the phase retardation is approximately 1.03° (1.09%). The retardation error is within the 5% uncertainty range of a commercial wave plate. Fortunately, the nonlinear error caused by the reflection phase retardation of the beam splitter dose not appear in the new system. Therefore the error could be attributed to misalignment and defects in the EO modulator or the other optical components. As for the repeatability of this new common-path heterodyne interferometer, the average deviation for the principal axis is 0.186° and the phase retardation is 0.356°. For the stability, the average deviation for the principal axis is 0.405° and the phase retardation is 0.635°. The resolution of this new system is estimated to be ∼0.5°, and the principal axis and phase retardation could be measured up to π and 2π, respectively, without ambiguity.

© 2004 Optical Society of America

OCIS Codes
(060.4080) Fiber optics and optical communications : Modulation
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(120.5410) Instrumentation, measurement, and metrology : Polarimetry

History
Original Manuscript: June 3, 2003
Revised Manuscript: December 4, 2003
Published: April 1, 2004

Citation
Yu-Lung Lo, Chun-Hau Lai, Jing-Fung Lin, and Ping-Feng Hsu, "Simultaneous absolute measurements of principal angle and phase retardation with a new common-path heterodyne interferometer," Appl. Opt. 43, 2013-2022 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-10-2013


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. H. B. Serreze, R. B. Goldner, “A phase-sensitive technique for measuring small birefringence changes,” Rev. Sci. Instrum. 45, 1613–1614 (1974). [CrossRef]
  2. Y. Shindo, H. Hanabusa, “Highly sensitive instrument for measuring optical birefringence,” Polymer Commun. 24, 240–244 (1983).
  3. C. M. Feng, Y. C. Huang, J. G. Chang, M. Chang, C. Chou, “A true phase sensitive optical heterodyne polarimeter on glucose concentration measurement,” Opt. Commun. 141, 314–321 (1997). [CrossRef]
  4. B. D. Cameron, G. L. Cote, “Noninvasive glucose sensing utilizing a digital closed-loop polarimetric approach,” IEEE Trans. Biomed. Eng. 44, 1221–1227 (1997). [CrossRef] [PubMed]
  5. A. Márquez, M. Yamauchi, J. A. Davis, D. J. Franich, “Phase measurement of a twist nematic liquid crystal spatial light modulator with a common-path interferometer,” Opt. Commun. 190, 129–133 (2001). [CrossRef]
  6. Y. L. Lo, P. F. Hsu, “Birefringence measurements by an electro-optic modulator using a new heterodyne scheme,” Opt. Eng. 41, 2764–2767 (2002). [CrossRef]
  7. B. Wang, T. C. Oakberg, “A new instrument for measuring both the magnitude and angle of low level linear birefringence,” Rev. Sci. Instrum. 70, 3847–3854 (1999). [CrossRef]
  8. S. Ohkubo, N. Umeda, “Near-field scanning optical microscope based on fast birefringence measurements,” Sensors Mater. 13, 433–443 (2001).
  9. W. A. Shurcliff, Polarized Light (Harvard U. Press, Cambridge, Mass., 1962).
  10. M. Abramowitz, I. A. Stegun, Handbook of Mathematical Functions (Natl. Bur. Standards, Washington, D.C., 1963).
  11. K. B. Rochford, A. H. Rose, C. M. Wang, “NIST study investigates retardance uncertainty,” Laser Focus World, 223–227 (1997).
  12. Y. Xie, Y. Z. Wu, “Zeeman laser interferometer errors for high-precision measurements,” Appl. Opt. 31, 881–884 (1992). [CrossRef] [PubMed]
  13. A. E. Rosenbluth, N. Bobroff, “Optical sources of nonlinearity in heterodyne interferometers,” Precis. Eng. 12, 7–11 (1990). [CrossRef]
  14. W. Hou, G. Wilkening, “Investigation and compensation of the nonlinearity of heterodyne interferometers,” Precis. Eng. 14, 91–98 (1992). [CrossRef]
  15. Y. Bitou, “Polarization mixing error reduction in a two-beam interferometer,” Opt. Rev. 9, 227–229 (2002). [CrossRef]
  16. H. Z. Hu, “Polarization heterodyne interferometry using a simple rotating analyzer. 1: theory and analysis,” Appl. Opt. 22, 2052–2056 (1983). [CrossRef]
  17. J. Y. Lin, D. C. Su, “A new type of optical heterodyne polarimeter,” Meas. Sci. Technol. 14, 55–58 (2003). [CrossRef]
  18. C. K. Lee, T. W. Wu , “Differential laser interferometer for nanometer displacement measurements, AIAA J. 33, 1675–1680 (1995).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited