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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 12 — Apr. 20, 2004
  • pp: 2456–2461

Experimental techniques using optically enabled ring oscillators

Joshua D. Schwartz, Michael B. Venditti, and David V. Plant  »View Author Affiliations


Applied Optics, Vol. 43, Issue 12, pp. 2456-2461 (2004)
http://dx.doi.org/10.1364/AO.43.002456


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Abstract

We present a method for characterizing transceiver performance in parallel optical data links. By establishing a bidirectional link between two optically enabled chips, the conditions for a ring oscillator are made possible. We propose this technique as a means of measuring the sensitivity of transceiver latency to controlled variables such as temperature, optical output power, supply voltage, and device misalignment. This method is noninvasive and independent of the packaging, circuit topology, and optical medium used. The technique is demonstrated experimentally, and results are compared with a simulation.

© 2004 Optical Society of America

OCIS Codes
(040.1240) Detectors : Arrays
(200.0200) Optics in computing : Optics in computing
(200.2610) Optics in computing : Free-space digital optics
(200.4650) Optics in computing : Optical interconnects

History
Original Manuscript: July 30, 2003
Revised Manuscript: February 3, 2004
Published: April 20, 2004

Citation
Joshua D. Schwartz, Michael B. Venditti, and David V. Plant, "Experimental techniques using optically enabled ring oscillators," Appl. Opt. 43, 2456-2461 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-12-2456


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References

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