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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 13 — May. 1, 2004
  • pp: 2695–2702

Windowed Fourier transform for fringe pattern analysis

Qian Kemao  »View Author Affiliations


Applied Optics, Vol. 43, Issue 13, pp. 2695-2702 (2004)
http://dx.doi.org/10.1364/AO.43.002695


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Abstract

Fringe patterns in optical metrology systems need to be demodulated to yield the desired parameters. Time-frequency analysis is a useful concept for fringe demodulation, and a windowed Fourier transform is chosen for the determination of phase and phase derivative. Two approaches are developed: the first is based on the concept of filtering the fringe patterns, and the second is based on the best match between the fringe pattern and computer-generated windowed exponential elements. I focus on the extraction of phase and phase derivatives from either phase-shifted fringe patterns or a single carrier fringe pattern. Principles as well as examples are given to show the effectiveness of the proposed methods.

© 2004 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(100.5070) Image processing : Phase retrieval
(100.7410) Image processing : Wavelets
(120.3940) Instrumentation, measurement, and metrology : Metrology
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

History
Original Manuscript: October 29, 2003
Revised Manuscript: January 27, 2004
Published: May 1, 2004

Citation
Qian Kemao, "Windowed Fourier transform for fringe pattern analysis," Appl. Opt. 43, 2695-2702 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-13-2695

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