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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 14 — May. 10, 2004
  • pp: 2884–2887

Surface characterization from doubly scattered light

Fernando Perez-Quintián and María A. Rebollo  »View Author Affiliations


Applied Optics, Vol. 43, Issue 14, pp. 2884-2887 (2004)
http://dx.doi.org/10.1364/AO.43.002884


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Abstract

When a translucent diffuser is illuminated by a speckle pattern, a new speckle pattern is produced. We show that the decorrelation of this intensity pattern by displacement of the diffusing surface is related to the standard deviation of the slope’s distribution when the illuminating speckle grain is chosen appropriately small. The experimental results are compared with those obtained by measuring the angular distribution of the mean scattered intensity, and they show good agreement with each other.

© 2004 Optical Society of America

OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(240.5770) Optics at surfaces : Roughness
(290.5880) Scattering : Scattering, rough surfaces

History
Original Manuscript: November 26, 2003
Revised Manuscript: February 17, 2004
Published: May 10, 2004

Citation
Fernando Perez-Quintián and María A. Rebollo, "Surface characterization from doubly scattered light," Appl. Opt. 43, 2884-2887 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-14-2884

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