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Applied Optics

Applied Optics


  • Vol. 43, Iss. 15 — May. 20, 2004
  • pp: 3028–3036

Total internal reflection ellipsometry: principles and applications

Hans Arwin, Michal Poksinski, and Knut Johansen  »View Author Affiliations

Applied Optics, Vol. 43, Issue 15, pp. 3028-3036 (2004)

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A concept for a measurement technique based on ellipsometry in conditions of total internal reflection is presented. When combined with surface plasmon resonance (SPR) effects, this technique becomes powerful for monitoring and analyzing adsorption and desorption on thin semitransparent metal films as well as for analyzing the semitransparent films themselves. We call this technique total internal reflection ellipsometry (TIRE). The theory of ellipsometry under total internal reflection combined with SPR is discussed for some simple cases. For more advanced cases and to prove the concept, simulations are performed with the Fresnel formalism. The use of TIRE is exemplified by applications in protein adsorption, corrosion monitoring, and adsorption from opaque liquids on metal surfaces. Simulations and experiments show greatly enhanced thin-film sensitivity compared with ordinary ellipsometry.

© 2004 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(240.6680) Optics at surfaces : Surface plasmons
(260.6970) Physical optics : Total internal reflection
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: December 5, 2003
Revised Manuscript: March 3, 2004
Published: May 20, 2004

Hans Arwin, Michal Poksinski, and Knut Johansen, "Total internal reflection ellipsometry: principles and applications," Appl. Opt. 43, 3028-3036 (2004)

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  19. The parameters for this simulation are set to match the settings necessary to generate the SPR effect.
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