Spectral and temporal characterization is a fundamental task when a tunable Ti:sapphire ultrafast laser system is operated for multiphoton microscopy applications. In the present paper simple procedures are reported that perform laser-peak-emission wavelength and bandwidth measurements without the need of any further instrumentation but a simple and inexpensive diffraction grating, by taking advantage of the confocal microscope imaging capabilities.
© 2004 Optical Society of America
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(140.4050) Lasers and laser optics : Mode-locked lasers
(170.0110) Medical optics and biotechnology : Imaging systems
(180.1790) Microscopy : Confocal microscopy
(190.4180) Nonlinear optics : Multiphoton processes
Franco Quercioli, Bruno Tiribilli, Massimo Vassalli, and Alessandro Ghirelli, "Laser Spectral Characterization in Multiphoton Microscopy," Appl. Opt. 43, 3055-3060 (2004)