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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 15 — May. 20, 2004
  • pp: 3055–3060

Laser spectral characterization in multiphoton microscopy

Franco Quercioli, Bruno Tiribilli, Massimo Vassalli, and Alessandro Ghirelli  »View Author Affiliations


Applied Optics, Vol. 43, Issue 15, pp. 3055-3060 (2004)
http://dx.doi.org/10.1364/AO.43.003055


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Abstract

Spectral and temporal characterization is a fundamental task when a tunable Ti:sapphire ultrafast laser system is operated for multiphoton microscopy applications. In the present paper simple procedures are reported that perform laser-peak-emission wavelength and bandwidth measurements without the need of any further instrumentation but a simple and inexpensive diffraction grating, by taking advantage of the confocal microscope imaging capabilities.

© 2004 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(140.4050) Lasers and laser optics : Mode-locked lasers
(170.0110) Medical optics and biotechnology : Imaging systems
(180.1790) Microscopy : Confocal microscopy
(190.4180) Nonlinear optics : Multiphoton processes

History
Original Manuscript: October 3, 2003
Revised Manuscript: January 28, 2004
Published: May 20, 2004

Citation
Franco Quercioli, Bruno Tiribilli, Massimo Vassalli, and Alessandro Ghirelli, "Laser spectral characterization in multiphoton microscopy," Appl. Opt. 43, 3055-3060 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-15-3055


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