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Applied Optics

Applied Optics


  • Vol. 43, Iss. 15 — May. 20, 2004
  • pp: 3061–3065

High-order correlations from rough-surface scattering

Zu-Han Gu  »View Author Affiliations

Applied Optics, Vol. 43, Issue 15, pp. 3061-3065 (2004)

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It is proposed to apply an optical setup of a randomly weak rough dielectric film on a reflecting metal substrate for the measurement of high-order correlations from rough-surface scattering. The angular amplitude and intensity correlations are measured. Because of multiple scattering, when the input laser beam size is comparatively small or close to the travel pass length inside the film, C(2) and C(3) are measured by subtraction of the amplitude correlation from the intensity correlation.

© 2004 Optical Society of America

OCIS Codes
(030.1640) Coherence and statistical optics : Coherence
(030.6140) Coherence and statistical optics : Speckle
(030.6600) Coherence and statistical optics : Statistical optics
(240.0310) Optics at surfaces : Thin films
(240.6700) Optics at surfaces : Surfaces
(290.1350) Scattering : Backscattering

Original Manuscript: July 4, 2003
Published: May 20, 2004

Zu-Han Gu, "High-order correlations from rough-surface scattering," Appl. Opt. 43, 3061-3065 (2004)

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