High-Order Correlations from Rough-Surface Scattering
Applied Optics, Vol. 43, Issue 15, pp. 3061-3065 (2004)
http://dx.doi.org/10.1364/AO.43.003061
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Abstract
It is proposed to apply an optical setup of a randomly weak rough dielectric film on a reflecting metal substrate for the measurement of high-order correlations from rough-surface scattering. The angular amplitude and intensity correlations are measured. Because of multiple scattering, when the input laser beam size is comparatively small or close to the travel pass length inside the film, C(2) and C(3) are measured by subtraction of the amplitude correlation from the intensity correlation.
© 2004 Optical Society of America
OCIS Codes
(030.1640) Coherence and statistical optics : Coherence
(030.6140) Coherence and statistical optics : Speckle
(030.6600) Coherence and statistical optics : Statistical optics
(240.0310) Optics at surfaces : Thin films
(240.6700) Optics at surfaces : Surfaces
(290.1350) Scattering : Backscattering
Citation
Zu-Han Gu, "High-Order Correlations from Rough-Surface Scattering," Appl. Opt. 43, 3061-3065 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-15-3061
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