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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 15 — May. 20, 2004
  • pp: 3073–3077

Local near-field enhancement of random Sb-SiN films

Ding Rong Ou, Jing Zhu, Ruo Jian Zhu, and Jia Wang  »View Author Affiliations


Applied Optics, Vol. 43, Issue 15, pp. 3073-3077 (2004)
http://dx.doi.org/10.1364/AO.43.003073


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Abstract

Local near-field enhancement of random Sb-SiN films has been studied. Specimens consisting of a random Sb-SiN film and an optical recording layer were prepared and exposed to a focused laser beam. Laser-induced ablation occurred on the recording layer adjacent to random Sb-SiN film much faster and at much lower power than on a single recording layer. These results indicate that an optical field can be enhanced by random Sb-SiN films. The enhanced field was subsequently investigated by scanning near-field optical microscopy, and the pictures revealed that the enhanced field was localized.

© 2004 Optical Society of America

OCIS Codes
(210.4770) Optical data storage : Optical recording
(290.5850) Scattering : Scattering, particles
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: September 17, 2003
Revised Manuscript: January 5, 2004
Published: May 20, 2004

Citation
Ding Rong Ou, Jing Zhu, Ruo Jian Zhu, and Jia Wang, "Local near-field enhancement of random Sb-SiN films," Appl. Opt. 43, 3073-3077 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-15-3073

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