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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 19 — Jul. 1, 2004
  • pp: 3772–3796

Profiled bar transmission gratings: soft-x-ray calibration of new Kirchoff solutions

Michael C. Hettrick, Michael E. Cuneo, John L. Porter, Larry E. Ruggles, Walter W. Simpson, Mark F. Vargas, and David F. Wenger  »View Author Affiliations


Applied Optics, Vol. 43, Issue 19, pp. 3772-3796 (2004)
http://dx.doi.org/10.1364/AO.43.003772


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Abstract

A new analytical model, derived rigorously from scalar diffraction theory, accurately fits soft-x-ray measurements of symmetrical profile gold transmission gratings in all diffracted orders. The calibration system selects numerous photon energies by use of a high-resolution grazing-incidence monochromator and a dc e-beam source. Fine-period free-standing gratings exhibit limited performance and require such testing to determine parameters of and select acceptable gratings for use in time-resolved (0.25 ns) spectrographs of known radiometric response. Unfolded spectra yield a Z-pinch plasma peak kT ∼250 eV, total radiated energy ∼900 kJ, and a pinch-driven gold-wall hohlraum Planckian kT ∼86 eV.

© 2004 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(050.1960) Diffraction and gratings : Diffraction theory
(300.6560) Spectroscopy : Spectroscopy, x-ray

History
Original Manuscript: September 25, 2003
Revised Manuscript: March 30, 2004
Published: July 1, 2004

Citation
Michael C. Hettrick, Michael E. Cuneo, John L. Porter, Larry E. Ruggles, Walter W. Simpson, Mark F. Vargas, and David F. Wenger, "Profiled bar transmission gratings: soft-x-ray calibration of new Kirchoff solutions," Appl. Opt. 43, 3772-3796 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-19-3772

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