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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 19 — Jul. 1, 2004
  • pp: 3938–3946

Picosecond-Resolution Soft-X-Ray Laser Plasma Interferometry

Jorge Filevich, Jorge J. Rocca, Mario C. Marconi, Raymond F. Smith, James Dunn, Roisin Keenan, James R. Hunter, Stephen J. Moon, Joseph Nilsen, Andrew Ng, and Vyacheslav N. Shlyaptsev  »View Author Affiliations


Applied Optics, Vol. 43, Issue 19, pp. 3938-3946 (2004)
http://dx.doi.org/10.1364/AO.43.003938


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Abstract

We describe a soft-x-ray laser interferometry technique that allows two-dimensional diagnosis of plasma electron density with picosecond time resolution. It consists of the combination of a robust high-throughput amplitude-division interferometer and a 14.7-nm transient-inversion soft-x-ray laser that produces ~5-ps pulses. Because of its picosecond resolution and short-wavelength scalability, this technique has the potential for extending the high inherent precision of soft-x-ray laser interferometry to the study of very dense plasmas of significant fundamental and practical interest, such as those investigated for inertial confinement fusion. Results of its use in the diagnostics of dense large-scale laser-created plasmas are presented.

© 2004 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
(340.7450) X-ray optics : X-ray interferometry
(350.5400) Other areas of optics : Plasmas

Citation
Jorge Filevich, Jorge J. Rocca, Mario C. Marconi, Raymond F. Smith, James Dunn, Roisin Keenan, James R. Hunter, Stephen J. Moon, Joseph Nilsen, Andrew Ng, and Vyacheslav N. Shlyaptsev, "Picosecond-Resolution Soft-X-Ray Laser Plasma Interferometry," Appl. Opt. 43, 3938-3946 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-19-3938

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