OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 21 — Jul. 20, 2004
  • pp: 4164–4171

Instantaneous Velocity Displacement and Contour Measurement by Use of Shadow Moiré and Temporal Wavelet Analysis

Cho Jui Tay, Chenggen Quan, Yu Fu, and Yuanhao Huang  »View Author Affiliations


Applied Optics, Vol. 43, Issue 21, pp. 4164-4171 (2004)
http://dx.doi.org/10.1364/AO.43.004164


View Full Text Article

Acrobat PDF (1848 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A temporal wavelet analysis method is proposed for velocity, displacement, and three-dimensional surface-profile measurement of a continuously deforming object by use of the shadow moiré technique. A grating is placed close to a deforming object, and its shadow is observed through the grating. The moiré fringe patterns, generated by the interference of the grating lines and their shadows, are captured by a high-speed CCD camera with a telecentric gauging lens. Instantaneous frequency of gray-value variation is evaluated point by point with the continuous wavelet transform. From the instantaneous frequency of each point on the object, the velocity, displacement, and high-quality surface profile at different instants can be retrieved. In this application, two specimens are tested to demonstrate the validity of the proposed method: One is a small coin with a rigid body motion, and the other is a simply supported beam subjected to a central point load. The results are compared with those obtained from temporal Fourier-transform and mechanical stylus methods.

© 2004 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(100.7410) Image processing : Wavelets
(120.4120) Instrumentation, measurement, and metrology : Moire' techniques
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

Citation
Cho Jui Tay, Chenggen Quan, Yu Fu, and Yuanhao Huang, "Instantaneous Velocity Displacement and Contour Measurement by Use of Shadow Moiré and Temporal Wavelet Analysis," Appl. Opt. 43, 4164-4171 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-21-4164


Sort:  Author  |  Year  |  Journal  |  Reset

References

  1. D. M. Meadows, W. O. Johnson, and J. B. Allen, “Generation of surface contours by moiré patterns,” Appl. Opt. 9, 942–947 (1970).
  2. H. Takasaki, “Moiré topography,” Appl. Opt. 9, 1467–1472 (1970).
  3. T. Tsuruta and Y. Itoh, “Interferometric generation of counter lines on opaque objects,” Opt. Commun. 1, 34–36 (1969).
  4. J. Wasowski, “Moiré topographic maps,” Opt. Commun. 2, 321–323 (1970).
  5. J. B. Allen and D. M. Meadows, “Removal of unwanted patterns from moiré contour maps by grid translation techniques,” Appl. Opt. 10, 210–212 (1971).
  6. Y. Arai, S. Yokozeki, and T. Yamada, “Fringe-scanning method using a general function for shadow moiré,” Appl. Opt. 34, 4877–4882 (1995).
  7. G. Mauvoisin, F. Bremand, and A. Lagarde, “Three-dimensional shape reconstruction by phase-shifting shadow moiré,” Appl. Opt. 33, 2163–2169 (1994).
  8. X. Xie, M. J. Lalor, D. R. Burton, and M. M. Shaw, “Four-map absolute distance contouring,” Opt. Eng. 36, 2517–1520 (1997).
  9. T. Yoshizawa and T. Tomisawa, “Shadow moiré topography by means of the phase-shift method,” Opt. Eng. 32, 1668–1674 (1993).
  10. L. Jin, Y. Kodera, T. Yoshizawa, and Y. Otani, “Shadow moiré profilometry using the phase-shifting method,” Opt. Eng. 39, 2119–2123 (2000).
  11. J. Degrieck, W. Van Paepegem, and P. Boone, “Application of digital phase-shift shadow moiré to micro deformation measurements of curved surface,” Opt. Lasers Eng. 36, 29–40 (2001).
  12. R. Henan, A. Tagliaferri, and R. Torroba, “A contouring approach using single grating digital shadow moiré with a phase stepping technique,” Optik 110, 199–201 (1999).
  13. J. D. Hovanesian and Y. Y. Hung, “Moiré contour-sum contour-difference, and vibration analysis of arbitrary objects,” Appl. Opt. 10, 2734–2738 (1971).
  14. Y. Y. Hung, C. Y. Liang, J. D. Hovanesian, and A. J. Durelli, “Time-averaged shadow-moiré method for studying vibrations,” Appl. Opt. 16, 1717–1719 (1977).
  15. B. Dessus and M. Leblanc, “The ‘fringe method’ and its application to the measurement of deformations, vibrations, contour lines and differences of objects,” Opto-electronics 5, 369–391 (1973).
  16. J. Fujimoto, “Determination of the vibration phase by a time-averaged shadow moiré method,” Appl. Opt. 21, 4373–4376 (1982).
  17. H. J. Tiziani, “Spectral and temporal phase evaluation for interferometry and speckle applications,” in Trends in Optical Nondestructive Testing and Inspection, P. K. Rastogi and D. Inaudi, eds. (Elsevier Science, Oxford, UK, 2000), pp. 323–343.
  18. J. M. Huntley and H. Saldner, “Temporal phase-unwrapping algorithm for automated interferogram analysis,” Appl. Opt. 32, 3047–3052 (1993).
  19. J. M. Huntley, “Challenges in phase unwrapping,” in Trends in Optical Nondestructive Testing and Inspection, P. K. Rastogi and D. Inaudi, eds. (Elsevier Science, Oxford, UK, 2000), pp. 37–44.
  20. C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large-object deformation,” Appl. Opt. 37, 2608–2614 (1998).
  21. C. Jonathan, B. Franze, P. Haible, and H. J. Tiziani, “Large in-plane displacement measurement in dual-beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).
  22. C. Jonathan, B. Franze, P. Haible, and H. J. Tiziani, “Novel temporal Fourier transform speckle pattern shearing interferometer,” Opt. Eng. 37, 1790–1795 (1998).
  23. H. Tiziani, B. Franze, and P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).
  24. M. Takeda and H. Yamamoto, “Fourier-transform speckle profilometry: three-dimensional shape measurements of diffuse objects with large height steps and/or spatially isolated surfaces,” Appl. Opt. 33, 7829–7837 (1994).
  25. L. H. Jin, Y. Otani, and T. Yoshizawa, “Shadow moiré profilometry by frequency sweeping,” Opt. Eng. 40, 1383–1386 (2001).
  26. C. Quan, Y. Fu, and C. J. Tay, “Determination of surface contour by temporal analysis of shadow moiré fringes,” Opt. Commun. 230, 23–33 (2004).
  27. M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. 72, 156–160 (1982).
  28. I. Daubechies, Ten Lectures on Wavelets (Society for Industrial and Applied Mathematics, Philadelphia, Pa., 1992).
  29. L. R. Watkins, S. M. Tan, and T. H. Barnes, “Determination of interferometer phase distributions by use of wavelets,” Opt. Lett. 24, 905–907 (1999).
  30. A. Federico and G. H. Kaufmann, “Evaluation of the continuous wavelet transform method for the phase measurement of electronic speckle pattern interferometry fringes,” Opt. Eng. 41, 3209–3216 (2002).
  31. J. Fang, C. Y. Xiong, and Z. L. Yang, “Digital transform processing of carrier fringe patterns from speckle-shearing interferometry,” J. Mod. Opt. 48, 507–520 (2001).
  32. Y. Morimoto, M. Fujigaki, and S. Yoneyama, “Shape, stress, and strain measurement using phase analysis of grating or fringe patterns,” in Third International Conference on Experimental Mechanics, X. Wu, Y. Qin, J. Fang, and J. Ke, eds., Proc. SPIE 4537, 47–52 (2002).
  33. K. Qian, H. S. Seah, and A. Asundi, “Instantaneous frequency and its application to strain extraction in moiré interferometry,” Appl. Opt. 42, 6504–6513 (2003).
  34. K. Kadooka, K. Kunoo, N. Uda, K. Ono, and T. Nagayasu, “Strain analysis for moiré interferometry using the two-dimensional continuous wavelet transform,” Exp. Mech. 43, 45–51 (2003).
  35. X. Colonna de Lega, “Continuous deformation measurement using dynamic phase-shifting and wavelet transform,” in Applied Optics and Optoelectronics 1996, K. T. V. Grattan, ed. (Institute of Physics, Bristol, UK, 1996), pp. 261–267.
  36. M. Cherbuliez, P. Jacquot, and X. Colonna de Lega, “Wavelet processing of interferometric signals and fringe patterns,” in Wavelet Applications in Signal and Image Processing, M. A. Unser, A. Aldroubi, A. F. Laine, eds., Proc. SPIE 3813, 692–702 (1999).
  37. S. Mallat, A Wavelet Tour of Signal Processing (Academic, San Diego, Calif., 1998).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited