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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 21 — Jul. 20, 2004
  • pp: 4182–4188

Absolute linearity measurements on HgCdTe detectors in the infrared region

Evangelos Theocharous, Juntaro Ishii, and Nigel P. Fox  »View Author Affiliations


Applied Optics, Vol. 43, Issue 21, pp. 4182-4188 (2004)
http://dx.doi.org/10.1364/AO.43.004182


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Abstract

The nonlinearity characteristics of photoconductive and photovoltaic HgCdTe detectors were experimentally investigated in the infrared wavelength region by use of the National Physical Laboratory detector linearity measurement facility. The nonlinearity of photoconductive HgCdTe detectors was shown to be a function of irradiance rather than the total radiant power incident on the detector. Photoconductive HgCdTe detectors supplied by different vendors were shown to have similar linearity characteristics for wavelengths around 10 μm. However, the nonlinearity of response of a photovoltaic HgCdTe detector was shown to be significantly lower than the corresponding value for photoconductive HgCdTe detectors at the same wavelength.

© 2004 Optical Society of America

OCIS Codes
(040.3060) Detectors : Infrared
(040.5160) Detectors : Photodetectors
(120.5630) Instrumentation, measurement, and metrology : Radiometry

History
Original Manuscript: January 30, 2004
Revised Manuscript: April 20, 2004
Published: July 20, 2004

Citation
Evangelos Theocharous, Juntaro Ishii, and Nigel P. Fox, "Absolute linearity measurements on HgCdTe detectors in the infrared region," Appl. Opt. 43, 4182-4188 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-21-4182


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