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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 22 — Aug. 1, 2004
  • pp: 4311–4321

High-Resolution Optical Angle Sensors: Approaching the Diffraction Limit to the Sensitivity

Augusto García-Valenzuela, Gabriel E. Sandoval-Romero, and Celia Sánchez-Pérez  »View Author Affiliations


Applied Optics, Vol. 43, Issue 22, pp. 4311-4321 (2004)
http://dx.doi.org/10.1364/AO.43.004311


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Abstract

We carry out a detailed analysis of angle-sensitive devices based on the critical-angle effect. We consider their use in measuring small angular deflections of a laser beam. We establish the diffraction limit to the sensitivity for optical-angle sensors based on reflection and transmission of a laser beam. We find that this limit is identical to that of the triangulation scheme when using a position-sensitive detector or the autocollimation scheme. We analyze the main proposals to date of optical-angle sensors based on the critical-angle effect, focusing on their maximum sensitivity and their polarization dependence in practical conditions. We propose and analyze theoretically a novel and simple angle-sensitive device for sensing optical-beam deflections with very low polarization dependence and a maximum sensitivity close to the diffraction limit when used with typical laser beams. We discuss the basic principles for designing this type of device, provide numerical results, and point out a convenient fabrication procedure.

© 2004 Optical Society of America

OCIS Codes
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.7280) Instrumentation, measurement, and metrology : Vibration analysis
(230.0250) Optical devices : Optoelectronics
(230.2090) Optical devices : Electro-optical devices
(230.5480) Optical devices : Prisms
(300.6430) Spectroscopy : Spectroscopy, photothermal

Citation
Augusto García-Valenzuela, Gabriel E. Sandoval-Romero, and Celia Sánchez-Pérez, "High-Resolution Optical Angle Sensors: Approaching the Diffraction Limit to the Sensitivity," Appl. Opt. 43, 4311-4321 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-22-4311


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