An optical setup that can be switched to produce in-plane and out-of-plane sensitivity interferometers was designed for three-dimensional deformation measuring by electronic speckle pattern interferometry. Divergent illumination is considered in the evaluation of sensitivity vectors to measure both in-plane and out-of-plane displacement components. The combination of these interferometers presents the advantage of greater sensitivity in directions <i>u</i>, <i>v</i>, and <i>w</i> than a typical interferometer with three illumination beams provides. The system and its basic operation are described, and results with an elastic target that is exposed to a mechanical load are reported.
© 2004 Optical Society of America
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
(150.3040) Machine vision : Industrial inspection
(200.4880) Optics in computing : Optomechanics
Amalia Martínez, Juan A. Rayas, Ramón Rodríguez-Vera, and Héctor J. Puga, "Three-Dimensional Deformation Measurement from the Combination of In-Plane and Out-Of-Plane Electronic Speckle Pattern Interferometers," Appl. Opt. 43, 4652-4658 (2004)