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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 25 — Sep. 1, 2004
  • pp: 4785–4785

Profiled bar transmission gratings: soft-x-ray calibration of new Kirchoff solutions—erratum

Michael C. Hettrick, Michael E. Cuneo, John L. Porter, Larry E. Ruggles, Walter W. Simpson, Mark F. Vargas, and David F. Wenger  »View Author Affiliations


Applied Optics, Vol. 43, Issue 25, pp. 4785-4785 (2004)
http://dx.doi.org/10.1364/AO.43.004785


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Abstract

In the original publication [Hettrick., Appl. Opt., 43, 3772–3796 (2004)], Eq. (6) and Fig. 30 were not presented properly. These misprints are corrected here.

© 2004 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(050.1960) Diffraction and gratings : Diffraction theory
(300.6560) Spectroscopy : Spectroscopy, x-ray

History
Original Manuscript: July 9, 2004
Manuscript Accepted: July 9, 2004
Published: September 1, 2004

Citation
Michael C. Hettrick, Michael E. Cuneo, John L. Porter, Larry E. Ruggles, Walter W. Simpson, Mark F. Vargas, and David F. Wenger, "Profiled bar transmission gratings: soft-x-ray calibration of new Kirchoff solutions—erratum," Appl. Opt. 43, 4785-4785 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-25-4785


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