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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 26 — Sep. 10, 2004
  • pp: 4993–4998

Spatial carrier-fringe pattern analysis by means of wavelet transform: wavelet transform profilometry

Jingang Zhong and Jiawen Weng  »View Author Affiliations


Applied Optics, Vol. 43, Issue 26, pp. 4993-4998 (2004)
http://dx.doi.org/10.1364/AO.43.004993


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Abstract

We present an analysis of a spatial carrier-fringe pattern in three-dimensional (3-D) shape measurement by using the wavelet transform, a tool excelling for its multiresolution in the time- and space-frequency domains. To overcome the limitation of the Fourier transform, we introduce the Gabor wavelet to analyze the phase distributions of the spatial carrier-fringe pattern. The theory of wavelet transform profilometry, an accuracy check by means of a simulation, and an example of 3-D shape measurement are shown.

© 2004 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(100.2650) Image processing : Fringe analysis
(100.3010) Image processing : Image reconstruction techniques
(100.7410) Image processing : Wavelets

History
Original Manuscript: February 3, 2004
Revised Manuscript: May 6, 2004
Published: September 10, 2004

Citation
Jingang Zhong and Jiawen Weng, "Spatial carrier-fringe pattern analysis by means of wavelet transform: wavelet transform profilometry," Appl. Opt. 43, 4993-4998 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-26-4993

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