We present an analysis of a spatial carrier-fringe pattern in three-dimensional (3-D) shape measurement by using the wavelet transform, a tool excelling for its multiresolution in the time- and space-frequency domains. To overcome the limitation of the Fourier transform, we introduce the Gabor wavelet to analyze the phase distributions of the spatial carrier-fringe pattern. The theory of wavelet transform profilometry, an accuracy check by means of a simulation, and an example of 3-D shape measurement are shown.
© 2004 Optical Society of America
(070.2590) Fourier optics and signal processing : ABCD transforms
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(100.2650) Image processing : Fringe analysis
(100.3010) Image processing : Image reconstruction techniques
(100.7410) Image processing : Wavelets
Jingang Zhong and Jiawen Weng, "Spatial Carrier-Fringe Pattern Analysis by Means of Wavelet Transform: Wavelet Transform Profilometry," Appl. Opt. 43, 4993-4998 (2004)