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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 29 — Oct. 10, 2004
  • pp: 5438–5442

Instrument for measuring small angles by use of multiple total internal reflections in heterodyne interferometry

Ming-Hung Chiu, Shinn-Fwu Wang, and Rong-Seng Chang  »View Author Affiliations


Applied Optics, Vol. 43, Issue 29, pp. 5438-5442 (2004)
http://dx.doi.org/10.1364/AO.43.005438


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Abstract

A new instrument for measuring small angles by use of multiple total internal reflections in heterodyne interferometry is presented. With this instrument we can achieve a small rotation angle only by measuring the variation in phase difference between s- and p-polarization states. To improve its sensitivity we increase the number of total internal reflections by using two parallelogram prisms instead of two right-angle prisms. The angular resolution of the new instrument is better than 2.2 × 10-6 rad over the measurement range -2.12° ≤ θ ≤ 2.12° for 20 total-internal reflections. The experimental results and the theoretical curve are in good agreement.

© 2004 Optical Society of America

OCIS Codes
(040.2840) Detectors : Heterodyne
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.6970) Physical optics : Total internal reflection

History
Original Manuscript: April 14, 2004
Revised Manuscript: June 30, 2004
Published: October 10, 2004

Citation
Ming-Hung Chiu, Shinn-Fwu Wang, and Rong-Seng Chang, "Instrument for measuring small angles by use of multiple total internal reflections in heterodyne interferometry," Appl. Opt. 43, 5438-5442 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-29-5438


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