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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 3 — Jan. 20, 2004
  • pp: 585–591

Polarized light scattering by dielectric and metallic spheres on oxidized silicon surfaces

Jung Hyeun Kim, Sheryl H. Ehrman, George W. Mulholland, and Thomas A. Germer  »View Author Affiliations


Applied Optics, Vol. 43, Issue 3, pp. 585-591 (2004)
http://dx.doi.org/10.1364/AO.43.000585


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Abstract

The polarization and intensity of light scattered by polystyrene latex and copper spheres with diameters of approximately 100 nm deposited onto silicon substrates containing various thicknesses of oxide films were measured with 532-nm light. The results are compared with a theory for scattering by a sphere on a surface, originally developed by others [Physica A 137, 209 (1986)] and extended to include coatings on the substrate. Nonlinear least-squares fits of the theory to the observations yield results that were consistent with differential mobility measurements of the particle diameter.

© 2004 Optical Society of America

OCIS Codes
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(240.0240) Optics at surfaces : Optics at surfaces
(290.0290) Scattering : Scattering
(350.4990) Other areas of optics : Particles

History
Original Manuscript: June 25, 2003
Revised Manuscript: October 14, 2003
Published: January 20, 2004

Citation
Jung Hyeun Kim, Sheryl H. Ehrman, George W. Mulholland, and Thomas A. Germer, "Polarized light scattering by dielectric and metallic spheres on oxidized silicon surfaces," Appl. Opt. 43, 585-591 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-3-585

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