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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 33 — Nov. 20, 2004
  • pp: 6090–6094

Wide-Field-of-View Polarization Interference Imaging Spectrometer

Chunmin Zhang, Baochang Zhao, and Bin Xiangli  »View Author Affiliations


Applied Optics, Vol. 43, Issue 33, pp. 6090-6094 (2004)
http://dx.doi.org/10.1364/AO.43.006090


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Abstract

A wide-field-of-view polarization interference imaging spectrometer (WPIIS) based on a modified Savart polariscope, without moving parts, and with a narrow slit has been designed. The primary feature of this device is for use with a large angle of incidence, and the target image as well as the interferogram can be obtained at the same time in the spatial domain and are recorded by a two-dimensional CCD camera. Under compensation, the field of view of the WPIIS will extend 3–5 times as large as a common interference imaging spectrometer, and throughput will raise 1–2 orders of magnitude. The developed optics is 20 × 8 cm ø in size. The spectral resolution of the prototype system is 86.8 cm−1 between 22222.2 and 11111.1 cm−1. This system has the advantages of being static and ultracompact with wide field of view and a very high throughput. The optics system and especially the wide-field-of-view compensation principle are described, and the experimental result of the interference imaging spectrum is shown.

© 2004 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6190) Spectroscopy : Spectrometers

Citation
Chunmin Zhang, Baochang Zhao, and Bin Xiangli, "Wide-Field-of-View Polarization Interference Imaging Spectrometer," Appl. Opt. 43, 6090-6094 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-33-6090


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