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Applied Optics

Applied Optics


  • Vol. 43, Iss. 34 — Dec. 1, 2004
  • pp: 6248–6254

Polariscope for simultaneous measurement of the principal axis and the phase retardation by use of two phase-locked extractions

Yu-Lung Lo, Jing-Fung Lin, and Sen-Yung Lee  »View Author Affiliations

Applied Optics, Vol. 43, Issue 34, pp. 6248-6254 (2004)

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A novel polariscope with electro-optic modulation that is capable of simultaneous measurement of the principal axis and the phase retardation of an optical linear birefringent medium by means of two phase-locked extractions is described. A phase compensator is used to suppress the transmission phase-retardation effect of the beam splitter, thereby enhancing the precision of the measuring performance. The validity of the proposed design is demonstrated by measurement of the principal axis and phase retardation of a quarter-wave plate sample. There are absolute errors of 0.25° on average and 0.58° at maximum in the principal-axis measurement and of 0.75° (0.83%) on average and 3.11° at maximum in the phase-retardation measurement. Meanwhile, the retardation error lies within a 5% uncertainty range of a commercial wave plate. The root-mean-square resolutions for the principal-axis angle and phase-retardation measurements are 0.042° and 0.081°, respectively. Finally, the dynamic ranges of the principal-axis angle measurement and the phase-retardation measurement extend as far as 180°.

© 2004 Optical Society of America

OCIS Codes
(060.4080) Fiber optics and optical communications : Modulation
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(120.5410) Instrumentation, measurement, and metrology : Polarimetry

Original Manuscript: April 13, 2004
Revised Manuscript: July 13, 2004
Published: December 1, 2004

Yu-Lung Lo, Jing-Fung Lin, and Sen-Yung Lee, "Polariscope for simultaneous measurement of the principal axis and the phase retardation by use of two phase-locked extractions," Appl. Opt. 43, 6248-6254 (2004)

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