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Applied Optics

Applied Optics


  • Vol. 43, Iss. 35 — Dec. 10, 2004
  • pp: 6391–6399

Gonioreflectometer for measuring spectral diffuse reflectance

Saulius Nevas, Farshid Manoocheri, and Erkki Ikonen  »View Author Affiliations

Applied Optics, Vol. 43, Issue 35, pp. 6391-6399 (2004)

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Gonioreflectometric determination of reflectance factors that involves hemispherical collection of reflected flux, which is an alternative to integrating sphere-based methods, is discussed. A detailed description of a gonioreflectometer built at the Helsinki University of Technology is presented. The instrument is used to establish an absolute scale of total diffuse reflectance factors throughout the spectral range 360–830 nm. The hemispherical reflectance factors are obtained through integration of the gonioreflectometric measurement results. The reflectance factors of white high-quality artifacts can be determined with a combined standard uncertainty of 0.20%. Results of test measurements were found to be in agreement with values traceable to other absolute scales based on integrating-sphere methods.

© 2004 Optical Society of America

OCIS Codes
(120.1840) Instrumentation, measurement, and metrology : Densitometers, reflectometers
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation

Original Manuscript: April 14, 2004
Revised Manuscript: September 15, 2004
Manuscript Accepted: September 15, 2004
Published: December 10, 2004

Saulius Nevas, Farshid Manoocheri, and Erkki Ikonen, "Gonioreflectometer for measuring spectral diffuse reflectance," Appl. Opt. 43, 6391-6399 (2004)

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