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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 35 — Dec. 10, 2004
  • pp: 6400–6406

Phase calibration of spatially nonuniform spatial light modulators

Xiaodong Xun and Robert W. Cohn  »View Author Affiliations


Applied Optics, Vol. 43, Issue 35, pp. 6400-6406 (2004)
http://dx.doi.org/10.1364/AO.43.006400


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Abstract

A new 512 × 512 pixel phase-only spatial light modulator (SLM) has been found to deviate from being flat by several wavelengths. Also, the retardation of the SLM relative to voltage varies across the device by as much as 0.25 wavelength. The birefringence of each pixel as a function of address voltage is measured from the intensity of the SLM between crossed polarizers. To these responses are added a reference spatial phase measured by phase shifting interferometry for a single address voltage. Fits to the measured data facilitate the compensation of the SLM to a root-mean-square wave-front error of 0.06 wavelength. The application of these corrections to flatten the full aperture of the SLM sharpens the focal plane spot and reduces the distortion of computer-designed diffraction patterns.

© 2004 Optical Society of America

OCIS Codes
(050.1970) Diffraction and gratings : Diffractive optics
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(230.6120) Optical devices : Spatial light modulators

History
Original Manuscript: July 7, 2004
Revised Manuscript: September 14, 2004
Manuscript Accepted: September 15, 2004
Published: December 10, 2004

Citation
Xiaodong Xun and Robert W. Cohn, "Phase calibration of spatially nonuniform spatial light modulators," Appl. Opt. 43, 6400-6406 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-35-6400

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