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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 36 — Dec. 20, 2004
  • pp: 6680–6687

Correction of phase distortion in spatial heterodyne spectroscopy

Christoph R. Englert, John M. Harlander, Joel G. Cardon, and Fred L. Roesler  »View Author Affiliations


Applied Optics, Vol. 43, Issue 36, pp. 6680-6687 (2004)
http://dx.doi.org/10.1364/AO.43.006680


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Abstract

The detailed analysis of measured interferograms generally requires phase correction. Phase-shift correction methods are commonly used and well documented for conventional Fourier-transform spectroscopy. However, measured interferograms can show additional phase errors, depending on the optical path difference and signal frequency, which we call phase distortion. In spatial heterodyne spectroscopy they can be caused, for instance, by optical defects or image distortions, making them a characteristic of the individual spectrometer. They can generally be corrected without significant loss of the signal-to-noise ratio. We present a technique to measure phase distortion by using a measured example interferogram. We also describe a technique to correct for phase distortion and test its performance by using a simulation with a near-UV solar spectrum. We find that for our measured example interferogram the phase distortion is small and nearly frequency independent. Furthermore, we show that the presented phase-correction technique is especially effective for apodized interferograms.

© 2004 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

History
Original Manuscript: June 4, 2004
Manuscript Accepted: August 30, 2004
Published: December 20, 2004

Citation
Christoph R. Englert, John M. Harlander, Joel G. Cardon, and Fred L. Roesler, "Correction of phase distortion in spatial heterodyne spectroscopy," Appl. Opt. 43, 6680-6687 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-36-6680

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