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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 4 — Feb. 1, 2004
  • pp: 820–823

Interferometric monitoring of dip coating

Alexandre F. Michels, Thiago Menegotto, and Flavio Horowitz  »View Author Affiliations


Applied Optics, Vol. 43, Issue 4, pp. 820-823 (2004)
http://dx.doi.org/10.1364/AO.43.000820


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Abstract

Dip-coated films, which are widely used in the coating industry, are usually measured by capacitive methods with micrometric precision. For the first time to our knowledge, we have applied an interferometric determination of the evolution of thickness in real time to nonvolatile Newtonian mineral oils with several viscosities and distinct dip withdrawing speeds. The evolution of film thickness during the process depends on time as t-1/2, in accordance with a simple model. Comparison with measured results with an uncertainty of ±0.007 μm) showed good agreement after the initial steps of the process had been completed.

© 2004 Optical Society of America

OCIS Codes
(260.3160) Physical optics : Interference
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: August 8, 2003
Published: February 1, 2004

Citation
Alexandre F. Michels, Thiago Menegotto, and Flavio Horowitz, "Interferometric monitoring of dip coating," Appl. Opt. 43, 820-823 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-4-820

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