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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 5 — Feb. 10, 2004
  • pp: 1038–1043

Resolution considerations in electro-optic, single interface deflectors

Stephen J. Barrington, Alexander J. Boyland, and Robert W. Eason  »View Author Affiliations


Applied Optics, Vol. 43, Issue 5, pp. 1038-1043 (2004)
http://dx.doi.org/10.1364/AO.43.001038


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Abstract

We discuss the maximum theoretical resolution of a single interface, electro-optically controllable beam deflector in domain-engineered LiNbO3 and report on experimental results for implementation of devices optimized either for maximum resolution or for maximum deflection angle. For the resolution optimized device we observed ∼50 resolvable spots for a ±1250-V range, which to our knowledge is a report of one of the highest ratios of resolution per volt from a solid-state electro-optic beam deflector.

© 2004 Optical Society of America

OCIS Codes
(120.5800) Instrumentation, measurement, and metrology : Scanners
(130.0130) Integrated optics : Integrated optics
(130.3120) Integrated optics : Integrated optics devices
(130.3730) Integrated optics : Lithium niobate
(230.2090) Optical devices : Electro-optical devices

History
Original Manuscript: March 6, 2003
Revised Manuscript: August 20, 2003
Published: February 10, 2004

Citation
Stephen J. Barrington, Alexander J. Boyland, and Robert W. Eason, "Resolution considerations in electro-optic, single interface deflectors," Appl. Opt. 43, 1038-1043 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-5-1038

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