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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 7 — Mar. 1, 2004
  • pp: 1480–1484

Detection and measurement of waviness on thin metallic wires

Cesar Tejeda, Luis Miguel Sanchez-Brea, and Eusebio Bernabeu  »View Author Affiliations


Applied Optics, Vol. 43, Issue 7, pp. 1480-1484 (2004)
http://dx.doi.org/10.1364/AO.43.001480


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Abstract

We propose a model for determining the far-field diffraction pattern of wires with waviness. Analytical solutions are obtained by means of the stationary phase method, which allows us to determine dimensional parameters such as wire diameter and waviness factor. Experimental results are presented, which are in accordance with our theoretical description.

© 2004 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(240.6700) Optics at surfaces : Surfaces

History
Original Manuscript: August 2, 2003
Revised Manuscript: October 21, 2003
Published: March 1, 2004

Citation
Cesar Tejeda, Luis Miguel Sanchez-Brea, and Eusebio Bernabeu, "Detection and measurement of waviness on thin metallic wires," Appl. Opt. 43, 1480-1484 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-7-1480

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