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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 7 — Mar. 1, 2004
  • pp: 1485–1492

Nondestructive measurement of an optical fiber refractive-index profile by a transmitted-light differential interference contact microscope

Zhongyao Liu, Xiaoman Dong, Qianghua Chen, Chunyong Yin, Yuxian Xu, and Yingjun Zheng  »View Author Affiliations


Applied Optics, Vol. 43, Issue 7, pp. 1485-1492 (2004)
http://dx.doi.org/10.1364/AO.43.001485


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Abstract

A novel transmitted-light differential interference contrast (DIC) system is used for nondestructive measurement of the refractive-index profile (RIP) of an optical fiber. By means of this system the phase of a measured light beam can be modulated with an analyzer, and the phase distribution of a fiber is obtained by calculation of the various interference patterns. The measurement theory and structure and some typical applications of this system are demonstrated. The results of measuring RIPs in graded-index fiber are presented. Both the experimental results and theoretical analysis show that the system takes the advantage of high index resolution and of sufficient measurement accuracy for measuring the refractive index of the optical fiber. The system has strong ability to overcome environmental disturbance because of its common-path design. Moreover, one can use the system to measure the RIP along the fiber axis and acquire an image of the three-dimensional RIP of the fiber.

© 2004 Optical Society of America

OCIS Codes
(060.2300) Fiber optics and optical communications : Fiber measurements
(100.6890) Image processing : Three-dimensional image processing
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(180.3170) Microscopy : Interference microscopy

History
Original Manuscript: August 27, 2003
Revised Manuscript: November 7, 2003
Published: March 1, 2004

Citation
Zhongyao Liu, Xiaoman Dong, Qianghua Chen, Chunyong Yin, Yuxian Xu, and Yingjun Zheng, "Nondestructive measurement of an optical fiber refractive-index profile by a transmitted-light differential interference contact microscope," Appl. Opt. 43, 1485-1492 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-7-1485

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