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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 7 — Mar. 1, 2004
  • pp: 1503–1507

Effects of phase change on reflection in phase-measuring interference microscopy

Arnaud Dubois  »View Author Affiliations


Applied Optics, Vol. 43, Issue 7, pp. 1503-1507 (2004)
http://dx.doi.org/10.1364/AO.43.001503


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Abstract

We show by analytical and numerical calculations that the phase change on reflection that occurs in interference microscopy is almost independent of the numerical aperture of the objective. The shift of the microscope interferogram response due to the phase change on reflection, however, increases with the numerical aperture. Measurements of the interferogram shift are made with a Linnik interference microscope equipped with various numerical-aperture objectives and are reported and compared with theory.

© 2004 Optical Society of America

OCIS Codes
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(180.3170) Microscopy : Interference microscopy

History
Original Manuscript: August 14, 2003
Revised Manuscript: November 11, 2003
Published: March 1, 2004

Citation
Arnaud Dubois, "Effects of phase change on reflection in phase-measuring interference microscopy," Appl. Opt. 43, 1503-1507 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-7-1503


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