Effects of Phase Change on Reflection in Phase-Measuring Interference Microscopy
Applied Optics, Vol. 43, Issue 7, pp. 1503-1507 (2004)
http://dx.doi.org/10.1364/AO.43.001503
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Abstract
We show by analytical and numerical calculations that the phase change on reflection that occurs in interference microscopy is almost independent of the numerical aperture of the objective. The shift of the microscope interferogram response due to the phase change on reflection, however, increases with the numerical aperture. Measurements of the interferogram shift are made with a Linnik interference microscope equipped with various numerical-aperture objectives and are reported and compared with theory.
© 2004 Optical Society of America
OCIS Codes
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(180.3170) Microscopy : Interference microscopy
Citation
Arnaud Dubois, "Effects of Phase Change on Reflection in Phase-Measuring Interference Microscopy," Appl. Opt. 43, 1503-1507 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-7-1503
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