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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 43, Iss. 8 — Mar. 10, 2004
  • pp: 1734–1746

Analysis and numerical computation of diffraction of an optical field by a subwavelength-size aperture in a thick metallic screen by use of a volume integral equation

Kazuo Tanaka and Masahiro Tanaka  »View Author Affiliations


Applied Optics, Vol. 43, Issue 8, pp. 1734-1746 (2004)
http://dx.doi.org/10.1364/AO.43.001734


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Abstract

Diffraction of an optical field by an aperture in a thick metallic screen is analyzed numerically by use of a three-dimensional volume integral equation together with a generalized conjugate residual method and fast Fourier transformation. Numerical results were validated by reciprocity and the independence of the results of the truncated discretized volume size used in numerical calculations. Near and far fields of square, circular, and triangular apertures in a thick screen are obtained numerically. Some of the numerical results obtained in the present study agree with previously reported experimental results. The surface plasmon polaritons excited on the sidewalls of the aperture can explain the basic characteristics of near-field distribution of apertures. The Bethe–Bouwkamp theory was found to be insufficient to explain the basic characteristics of the near field around the subwavelength aperture in a practical metallic screen.

© 2004 Optical Society of America

OCIS Codes
(050.1220) Diffraction and gratings : Apertures
(050.1960) Diffraction and gratings : Diffraction theory
(180.5810) Microscopy : Scanning microscopy
(230.7370) Optical devices : Waveguides
(350.5400) Other areas of optics : Plasmas

History
Original Manuscript: March 28, 2003
Revised Manuscript: October 30, 2003
Published: March 10, 2004

Citation
Kazuo Tanaka and Masahiro Tanaka, "Analysis and numerical computation of diffraction of an optical field by a subwavelength-size aperture in a thick metallic screen by use of a volume integral equation," Appl. Opt. 43, 1734-1746 (2004)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-43-8-1734

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