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Applied Optics

Applied Optics


  • Vol. 43, Iss. 9 — Mar. 19, 2004
  • pp: 1819–1824

Jamin double-shearing interferometer for diffraction-limited wave-front test

Zhu Luan, Liren Liu, De’an Liu, and Shuyun Teng  »View Author Affiliations

Applied Optics, Vol. 43, Issue 9, pp. 1819-1824 (2004)

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A Jamin double-shearing interferometer with three changeable schemes is proposed for the measurement of diffraction-limited laser wave front. A concept of detectable wave-front height is thus defined, and on this basis the limits of detectable wave-front height from the suggested schemes of interferometer are analyzed. The design is detailed, the simulation for wave aberrations is given, and the experiment is demonstrated. One of the major features of this interferometer is that it is capable of visually testing a diffraction-limited wave front immediately by the fringes with the matched accuracy and minimum detectable wave-front height on the order of 0.1λ.

© 2004 Optical Society of America

OCIS Codes
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.3180) Instrumentation, measurement, and metrology : Interferometry

Original Manuscript: September 22, 2003
Revised Manuscript: January 8, 2004
Published: March 20, 2004

Zhu Luan, Liren Liu, De’an Liu, and Shuyun Teng, "Jamin double-shearing interferometer for diffraction-limited wave-front test," Appl. Opt. 43, 1819-1824 (2004)

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