We have developed a spectrogonio radiometer to measure in the laboratory (−35 °C to +30 °C) the bidirectional reflectance and polarization distribution functions of various types of planetary material from the UV to the near-IR (310–4800 nm). The major, to our knowledge, novel feature of this instrument is that it is capable of measuring dark to translucent materials with a high degree of radiometric accuracy under most viewing geometries. The sample surface is illuminated with a large monochromatic and polarized parallel beam (incidence: 0°–90°), and the total intensity and the two polarized components of the reflected light are measured (observation, 0°–80°; azimuth, 0°–180°). The scientific and technical constraints, the design, and the performances and limitations of the system are presented in this first paper.
© 2004 Optical Society of America
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.5880) Scattering : Scattering, rough surfaces
(300.6340) Spectroscopy : Spectroscopy, infrared
(300.6550) Spectroscopy : Spectroscopy, visible
Olivier Brissaud, Bernard Schmitt, Nicolas Bonnefoy, Sylvain Douté, Patrick Rabou, Will Grundy, and Michel Fily, "Spectrogonio Radiometer for the Study of the Bidirectional Reflectance and Polarization Functions of Planetary Surfaces. 1. Design and Tests," Appl. Opt. 43, 1926-1937 (2004)