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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 12 — Apr. 20, 2005
  • pp: 2250–2257

Multiwindowed Defocused Electronic Speckle Photographic System for Tilt Measurement

Jose M. Diazdelacruz  »View Author Affiliations


Applied Optics, Vol. 44, Issue 12, pp. 2250-2257 (2005)
http://dx.doi.org/10.1364/AO.44.002250


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Abstract

Defocused speckle photography has long been used to measure rotations of rough surfaces. By addition of a suitably perforated mask, some measurement properties, such as range and lateral resolution, may be changed at will. In particular, the maximum measurable tilt can be significantly increased, although at the expense of poorer lateral resolution. Advantages of this compared with previously described techniques include independent tuning of speckle size and optical system aperture and greater adaptability to various measuring needs. The benefits and disadvantages of the new and old techniques are thoroughly compared.

© 2005 Optical Society of America

OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing

History
Original Manuscript: February 17, 2004
Revised Manuscript: June 21, 2004
Manuscript Accepted: November 24, 2004
Published: April 20, 2005

Citation
Jose M. Diazdelacruz, "Multiwindowed Defocused Electronic Speckle Photographic System for Tilt Measurement," Appl. Opt. 44, 2250-2257 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-12-2250

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