OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 12 — Apr. 20, 2005
  • pp: 2349–2358

Determination of the size and structure of an X-pinch x-ray source from the diffraction pattern produced by microfabricated slits

Byung Moo Song, Sergei A. Pikuz, Tatiania A. Shelkovenko, and David A. Hammer  »View Author Affiliations


Applied Optics, Vol. 44, Issue 12, pp. 2349-2358 (2005)
http://dx.doi.org/10.1364/AO.44.002349


View Full Text Article

Enhanced HTML    Acrobat PDF (1750 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

X-pinch plasma emits subnanosecond bursts of x rays in the 3–10-keV energy range from a small source. As such, it has been used for high-resolution point-projection imaging of small, dense, rapidly changing plasmas as well as for submillimeter-thick biological samples. In addition to the effect of source size on geometric resolution, a small source size can also provide high spatial coherence of x rays, enabling the rays to be used for imaging weakly absorbing objects with excellent spatial resolution by a method called phase-contrast imaging. To determine the source size, we microfabricated gold slits and imaged them in a point-projection radiography configuration. The shape of the shadow image pattern depends on the source size and energy band of the x rays, the shape and material used for the slits, and the geometry of the experiment. Experimental results have been compared with wave-optics calculations of the expected image pattern as a function of all the parameters listed above. For example, assuming a Gaussian source distribution, an effective source size in 2.5–4.1 Å radiation (1 Å = 0.1 nm) of 1.2 ± 0.5 µm (full width at half-maximum) was determined for a 20-µm Mo wire X pinch. Characterization of the size and structure of the x-ray bursts from X pinches by the use of different wire materials and different slit structures is made.

© 2005 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction

History
Original Manuscript: June 3, 2004
Revised Manuscript: November 19, 2004
Manuscript Accepted: November 19, 2004
Published: April 20, 2005

Citation
Byung Moo Song, Sergei A. Pikuz, Tatiania A. Shelkovenko, and David A. Hammer, "Determination of the size and structure of an X-pinch x-ray source from the diffraction pattern produced by microfabricated slits," Appl. Opt. 44, 2349-2358 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-12-2349

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited