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Applied Optics

Applied Optics


  • Vol. 44, Iss. 13 — May. 1, 2005
  • pp: 2558–2563

Scanning near-field optical microscopy as a tool for the characterization of multimode interference devices

Matthieu J. Martin, Taha Benyattou, Régis Orobtchouk, Frédéric Rooms, Alain Morand, Isabelle Schanen, and Pierre Benech  »View Author Affiliations

Applied Optics, Vol. 44, Issue 13, pp. 2558-2563 (2005)

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We report the scanning near-field optical microscopy (SNOM) characterization of a 4 × 4 multimode interference (MMI) device working at a wavelength of 1.55 µm and designed for astronomical signal recombination. A comprehensive analysis of the mapped propagating field is presented. We compare SNOM measurements with beam-propagation-method simulations and thus are able to determine the MMI structure's refractive-index contrast and show that the measured value is higher than the expected value. Further investigation allows us to demonstrate that good care must be taken with the refractive-index profile used in simulation when one deals with low-index contrast structures. We show evidence that a step-index contrast is not suitable for adequate simulation of our structure and present a model that permits good agreement between measured and simulated propagating fields.

© 2005 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(130.3120) Integrated optics : Integrated optics devices
(180.5810) Microscopy : Scanning microscopy
(230.7370) Optical devices : Waveguides

Original Manuscript: August 31, 2004
Revised Manuscript: November 24, 2004
Manuscript Accepted: November 24, 2004
Published: May 1, 2005

Matthieu J. Martin, Taha Benyattou, Régis Orobtchouk, Frédéric Rooms, Alain Morand, Isabelle Schanen, and Pierre Benech, "Scanning near-field optical microscopy as a tool for the characterization of multimode interference devices," Appl. Opt. 44, 2558-2563 (2005)

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