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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 15 — May. 20, 2005
  • pp: 2957–2962

Physically based reflectance model utilizing polarization measurement

Takayuki Nakano and Yasuhisa Tamagawa  »View Author Affiliations


Applied Optics, Vol. 44, Issue 15, pp. 2957-2962 (2005)
http://dx.doi.org/10.1364/AO.44.002957


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Abstract

A surface bidirectional reflectance distribution function (BRDF) depends on both the optical properties of the material and the microstructure of the surface and appears as combination of these factors. We propose a method for modeling the BRDF based on a separate optical-property (refractive-index) estimation by polarization measurement. Because the BRDF and the refractive index for precisely the same place can be determined, errors cased by individual difference or spatial dependence can be eliminated. Our BRDF model treats the surface as an aggregation of microfacets, and the diffractive effect is negligible because of randomness. An example model of a painted aluminum plate is presented.

© 2005 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(290.5880) Scattering : Scattering, rough surfaces

History
Original Manuscript: September 3, 2004
Revised Manuscript: December 1, 2004
Manuscript Accepted: January 6, 2005
Published: May 20, 2005

Citation
Takayuki Nakano and Yasuhisa Tamagawa, "Physically based reflectance model utilizing polarization measurement," Appl. Opt. 44, 2957-2962 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-15-2957


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