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Applied Optics

Applied Optics


  • Vol. 44, Iss. 16 — Jun. 1, 2005
  • pp: 3153–3159

Determination of optical birefringence by using off-axis transmission ellipsometry

Gerald E. Jellison, Jr. and Christopher M. Rouleau  »View Author Affiliations

Applied Optics, Vol. 44, Issue 16, pp. 3153-3159 (2005)

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Utilizing transmission ellipsometry at small angles of incidence, it is shown that c-cut uniaxial samples can be used to determine both the miscut of the optic axis with respect to the plane of incidence as well as very accurate values of the spectroscopic birefringence. For example, wafers of ZnO, LiNbO3, and 6H-SiC single-crystals are examined and the miscut direction and the spectroscopic birefringence are determined. While all materials show strong dispersion in birefringence, ZnO exhibits a distinct isotropic point at 396.8 nm.

© 2005 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(160.1190) Materials : Anisotropic optical materials
(260.1180) Physical optics : Crystal optics

Original Manuscript: June 15, 2004
Revised Manuscript: November 30, 2004
Manuscript Accepted: February 14, 2005
Published: June 1, 2005

Gerald E. Jellison and Christopher M. Rouleau, "Determination of optical birefringence by using off-axis transmission ellipsometry," Appl. Opt. 44, 3153-3159 (2005)

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