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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 19 — Jul. 1, 2005
  • pp: 3945–3953

Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry

Pablo D. Ruiz, Jonathan M. Huntley, and Ricky D. Wildman  »View Author Affiliations


Applied Optics, Vol. 44, Issue 19, pp. 3945-3953 (2005)
http://dx.doi.org/10.1364/AO.44.003945


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Abstract

We show, for the first time to our knowledge, how wavelength-scanning interferometry can be used to measure depth-resolved displacement fields through semitransparent scattering surfaces. Temporal sequences of speckle interferograms are recorded while the wavelength of the laser is tuned at a constant rate. Fourier transformation of the resultant three-dimensional (3-D) intensity distribution along the time axis reconstructs the scattering potential within the medium, and changes in the 3-D phase distribution measured between two separate scans provide the out-of-plane component of the 3-D displacement field. The principle of the technique is explained in detail and illustrated with a proof-of-principle experiment involving two independently tilted semitransparent scattering surfaces. Results are validated by standard two-beam electronic speckle pattern interferometry.

© 2005 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(140.3600) Lasers and laser optics : Lasers, tunable
(170.4500) Medical optics and biotechnology : Optical coherence tomography

History
Original Manuscript: November 23, 2004
Revised Manuscript: February 7, 2005
Manuscript Accepted: February 8, 2005
Published: July 1, 2005

Citation
Pablo D. Ruiz, Jonathan M. Huntley, and Ricky D. Wildman, "Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry," Appl. Opt. 44, 3945-3953 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-19-3945

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