OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 2 — Jan. 10, 2005
  • pp: 208–216

New model for the internal quantum efficiency of photodiodes based on photocurrent analysis

Alejandro Ferrero, Joaquin Campos, Alicia Pons, and Antonio Corrons  »View Author Affiliations


Applied Optics, Vol. 44, Issue 2, pp. 208-216 (2005)
http://dx.doi.org/10.1364/AO.44.000208


View Full Text Article

Acrobat PDF (149 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A new expression for the internal quantum efficiency of a photodiode is presented. It is obtained from the analysis of the photocurrent generated within the diode, considering the power and the cross-sectional diameter of the incident beam. The model explains variations of the internal quantum efficiency with irradiance that are not explained by other existing models, although this experimental fact was already known. The well-known phenomenon of supraresponsivity is also explained with this model. Finally, we show the dependence of the internal quantum efficiency on the variables involved in the model.

© 2005 Optical Society of America

OCIS Codes
(040.1880) Detectors : Detection
(120.1880) Instrumentation, measurement, and metrology : Detection
(120.5630) Instrumentation, measurement, and metrology : Radiometry

Citation
Alejandro Ferrero, Joaquin Campos, Alicia Pons, and Antonio Corrons, "New model for the internal quantum efficiency of photodiodes based on photocurrent analysis," Appl. Opt. 44, 208-216 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-2-208


Sort:  Author  |  Year  |  Journal  |  Reset

References

  1. M. Born and E. Wolf, Principles of Optics (Pergamon, New York, 1975), Chap. 1.
  2. J. Geist, E. F. Zalewski, and A. R. Schaefer, "Spectral response self-calibration and interpolation of silicon photodiodes," Appl. Opt. 19, 3795-3799 (1980).
  3. T. R. Gentile, J. M. Houston, and C. L. Cromer, "Realization of a scale of absolute spectral response using the National Institute of Standards and Technology high-accuracy cryogenic radiometer," Appl. Opt. 35, 4392-4403 (1996).
  4. L. P. Boivin, "Automated absolute and relative spectral linearity measurements on photovoltaic detectors," Metrologia 30, 355-360 (1993).
  5. A. S. Grove, Physics and Technology of Semiconductor Devices (Wiley, New York, 1967), Chaps. 4-6, pp. 91-207.
  6. R. N. Hall, "Electron-hole recombination in germanium," Phys. Rev. 87, 387 (1952).
  7. W. Shockley and W. T. Read, "Statistics of the recombination of holes and electrons," Phys. Rev. 87, 835-842 (1952).
  8. A. R. Schaefer, E. F. Zalewski, and J. Geist, "Silicon detector nonlinearity and related effects," Appl. Opt. 22, 1232-1235 (1983).
  9. L. Werner, J. Fischer, U. Johannsen, and J. Hartmann, "Accurate determination of the spectral responsivity of silicon trap detectors between 238 nm and 1015 nm using a laser-based cryogenic radiometer," Metrologia 37, 279-284 (2000).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited