Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique
Applied Optics, Vol. 44, Issue 20, pp. 4205-4210 (2005)
http://dx.doi.org/10.1364/AO.44.004205
Acrobat PDF (690 KB)
Abstract
A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO3 crystal is reported along with the measurement results from a real BGA substrate.
© 2005 Optical Society of America
OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
Citation
Wen-Kai Kuo, Deng-Tzung Tang, Chien-Jang Wu, and Thomson Lai, "Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique," Appl. Opt. 44, 4205-4210 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-20-4205
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Optimization of retardance for a complete Stokes polarimeter (OL)
- Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy of surfaces and films (JOSAA)
- Spectroscopic polarimetry with a channeled spectrum (OL)
- Three-dimensional electric-field vector measurement with an electro-optic sensing technique (OL)
- Optical Properties of Alumina Titanium Carbide Sliders Used in Rigid Disk Drives (AO)
Related Conference Papers
- Miniaturized Channeled Spectropolarimeter
- Fast wavelength-parallel polarization sensor for multi-wavelength optical networks
- Condition Number as a Metric for the Effectiveness of Polarimetric Algorithms
- Three-Dimensional Complete Polarization Sensitive Imaging Using a Confocal Mueller Matrix Imaging Polarimeter
- Experimental Direct Characterization of a Quantum Process
« Previous Article | Next Article »
OSA is a member of 