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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 21 — Jul. 20, 2005
  • pp: 4470–4474

Relationship between microscanned image quality and fill factor of detectors

Xiao-rui Wang, Jian-qi Zhang, Zhuo-Xiang Feng, and Hong-Hua Chang  »View Author Affiliations


Applied Optics, Vol. 44, Issue 21, pp. 4470-4474 (2005)
http://dx.doi.org/10.1364/AO.44.004470


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Abstract

Microscanning is an important technique in high-resolution electro-optical imaging. It can increase the resolution and improve the performance of imaging systems. For optimum design of a staring imaging system with microscanning modes it is necessary to choose the optimum microscanning mode according to the fill factor of the detector. Hence it is important to study the effect of the fill factor on the microscanning image quality. With some assumptions, we introduce the sampling-averaging modulation transfer function of a detector array at the spatial Nyquist frequency with which to study quantitatively the improvement in image quality of various microscanning modes for selected fill factors (1, 2/3, and 1/2). Analytical results show that the amount of improvement is closely associated with the fill factor. Finally, typical sampling imaging of focal plane arrays with these fill factors are simulated. Experimental results qualitatively describe the effect of the fill factor on the microscanning image and show good agreement with theoretical analysis.

© 2005 Optical Society of America

OCIS Codes
(040.1240) Detectors : Arrays
(040.1880) Detectors : Detection
(110.3000) Imaging systems : Image quality assessment

Citation
Xiao-rui Wang, Jian-qi Zhang, Zhuo-Xiang Feng, and Hong-Hua Chang, "Relationship between microscanned image quality and fill factor of detectors," Appl. Opt. 44, 4470-4474 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-21-4470


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References

  1. S. K. Park and Z. Rahman, "Fidelity analysis of sampled image systems," Opt. Eng. 38, 786-800 (1999). [CrossRef]
  2. X.-F. Chi, Y.-H. Yu, C.-Y. Han, and Z.-D. Yin, "Analysis of aliasing noise in a sampled-imaging system," J. Jilin Univ. 20, 26-29 (2002; in Chinese).
  3. F. O. Huck and C. L. Fales, "Information-theoretical assessment of sampled imaging systems," Opt. Eng. 38, 742-762 (1999). [CrossRef]
  4. X.-R. Wang, J.-Q. Zhang, H.-H. Chang, and X. Liu, "A new method to characterize IR imaging systems performance," Infrared Technol. 25, 24-28 (2003; in Chinese).
  5. S. K. Park and R. Hazra, "Aliasing as noise: a quantitative and qualitative assessment, in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV, G. C. Holst, ed., Proc. SPIE 1969, 54-65 (1993). [CrossRef]
  6. K. Krapels, R. Dreiggers, R. Vollmerhausen, and C. Halford, "A performance comparison of rectangular (4-point) and diagonal (2-point) dither, in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI, G. C. Holst, ed., Proc. SPIE 4030, 151-169 (2000). [CrossRef]
  7. K. M. Hock, "Effect of oversampling in pixel arrays," Opt. Eng. 34, 1281-1288 (1995).
  8. L. deLuca and G. Cardone, "Modulation transfer function cascades model for a sampled IR imaging system," Appl. Opt. 13, 1659-1664 (1991).
  9. J. Fortin and P. Chevere, "Realization of a fast microscanning device for infrared focal plane arrays," in Targets and Backgrounds: Characterization and Representation II, W. R. Watkins, and D. Clement, eds., Proc. SPIE 2742, 185-196 (1996). [CrossRef]
  10. E. A. Watson, R. A. Muse, and F. P. Blommel, "Aliasing and blurring in microscanning imagery," in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing III, G. C. Holst, ed., Proc. SPIE 1689, 242-250 (1992). [CrossRef]
  11. Y.-P. Zuo and J.-Q. Zhang, "Modeling and simulation of microscanning imaging systems in several patterns," J. Infrared Millimeter Waves 22, 145-148 (2003; in Chinese).
  12. O. Hadar and G. D. Boreman, "Oversampling requirements for pixilated-imager systems," Opt. Eng. 38, 782-785 (1999). [CrossRef]

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