Abstract

Ordered mesoporous and nonporous silica films were studied by analysis of reflection spectra and hemispherical elastic light scattering (HELS). The real and imaginary parts of the index of the films were estimated from the reflection spectra. The HELS angular distribution of the mesoporous film shows a minimum, which has been interpreted as an interference pattern coming from the beams scattered by the mesopores.

© 2005 Optical Society of America

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