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Applied Optics

Applied Optics


  • Vol. 44, Iss. 21 — Jul. 20, 2005
  • pp: 4538–4546

Scattering and reflective properties of ordered mesoporous silica films

Valeriy A. Sterligov  »View Author Affiliations

Applied Optics, Vol. 44, Issue 21, pp. 4538-4546 (2005)

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Ordered mesoporous and nonporous silica films were studied by analysis of reflection spectra and hemispherical elastic light scattering (HELS). The real and imaginary parts of the index of the films were estimated from the reflection spectra. The HELS angular distribution of the mesoporous film shows a minimum, which has been interpreted as an interference pattern coming from the beams scattered by the mesopores.

© 2005 Optical Society of America

OCIS Codes
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: April 13, 2004
Revised Manuscript: January 12, 2005
Manuscript Accepted: February 4, 2005
Published: July 20, 2005

Valeriy A. Sterligov, "Scattering and reflective properties of ordered mesoporous silica films," Appl. Opt. 44, 4538-4546 (2005)

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