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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 22 — Aug. 1, 2005
  • pp: 4639–4647

Self-referenced prism deflection measurement schemes with microradian precision

Rebecca Olson, Justin Paul, Scott Bergeson, and Dallin S. Durfee  »View Author Affiliations


Applied Optics, Vol. 44, Issue 22, pp. 4639-4647 (2005)
http://dx.doi.org/10.1364/AO.44.004639


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Abstract

We have demonstrated several inexpensive methods that can be used to measure the deflection angles of prisms with microradian precision. The methods are self-referenced, where various reversals are used to achieve absolute measurements without the need of a reference prism or any expensive precision components other than the prisms under test. These techniques are based on laser interferometry and have been used in our laboratory to characterize parallel-plate beam splitters, penta prisms, right-angle prisms, and corner cube reflectors using only components typically available in an optics laboratory.

© 2005 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(230.1360) Optical devices : Beam splitters
(230.5480) Optical devices : Prisms

History
Original Manuscript: November 1, 2004
Revised Manuscript: March 11, 2005
Manuscript Accepted: March 31, 2005
Published: August 1, 2005

Citation
Rebecca Olson, Justin Paul, Scott Bergeson, and Dallin S. Durfee, "Self-referenced prism deflection measurement schemes with microradian precision," Appl. Opt. 44, 4639-4647 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-22-4639

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