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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 44, Iss. 23 — Aug. 10, 2005
  • pp: 4860–4869

Interframe intensity correlation matrix for self-calibration in phase-shifting interferometry

Hae Young Yun and Chung Ki Hong  »View Author Affiliations


Applied Optics, Vol. 44, Issue 23, pp. 4860-4869 (2005)
http://dx.doi.org/10.1364/AO.44.004860


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Abstract

A new method of estimating reference phase shifts in phase-shifting interferometry is proposed. The reference phase shifts are determined from a matrix that represents the interframe intensity correlation (IIC) of phase-shifted interferograms. The root-mean-square error of intensity measurement is automatically obtained from the smallest eigenvalue of the IIC matrix. The proposed method requires only four interferograms, unlike others, and can extract phase shifts reliably even from interferograms without well-defined fringes, such as speckle patterns. In typical conditions, reference phase shifts and wave-front phases can be determined with an accuracy of λ/6310 and λ/150, respectively. The validity of the method is tested by comparing it with other methods in experiments and simulations.

© 2005 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

History
Original Manuscript: December 8, 2004
Revised Manuscript: April 4, 2005
Manuscript Accepted: April 4, 2005
Published: August 10, 2005

Citation
Hae Young Yun and Chung Ki Hong, "Interframe intensity correlation matrix for self-calibration in phase-shifting interferometry," Appl. Opt. 44, 4860-4869 (2005)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-44-23-4860


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