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Applied Optics

Applied Optics


  • Vol. 44, Iss. 26 — Sep. 10, 2005
  • pp: 5393–5397

Optical approach to angular displacement measurement based on attenuated total reflection

Fan Chen, Zhuangqi Cao, Qishun Shen, and Yaojun Feng  »View Author Affiliations

Applied Optics, Vol. 44, Issue 26, pp. 5393-5397 (2005)

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An optical approach for angular displacement measurement (ADM) based on the attenuated total reflection technique is presented. As a laser beam is incident upon a planar optical waveguide, an m line is obtained by scanning the incident angle. Theoretical analysis shows that the m line sharply shifts with a tiny variation of the thickness of the waveguided layer. And the specific schemes for ADM, which are based on the angular interrogation and the intensity measurement, are analyzed. The calculated result of sensitivity demonstrates that the intensity measurement is more efficient than the angular interrogation. Furthermore, small incident angles indicate higher sensitivity to the angular displacement than relatively large incident angles for the intensity measurement.

© 2005 Optical Society of America

OCIS Codes
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(230.7390) Optical devices : Waveguides, planar

Original Manuscript: January 27, 2005
Revised Manuscript: March 24, 2005
Manuscript Accepted: April 27, 2005
Published: September 10, 2005

Fan Chen, Zhuangqi Cao, Qishun Shen, and Yaojun Feng, "Optical approach to angular displacement measurement based on attenuated total reflection," Appl. Opt. 44, 5393-5397 (2005)

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