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Applied Optics

Applied Optics


  • Vol. 44, Iss. 27 — Sep. 20, 2005
  • pp: 5778–5785

Phase-shifting interferometry by a covariance-based method

Abhijit Patil, Pramod Rastogi, and Benny Raphael  »View Author Affiliations

Applied Optics, Vol. 44, Issue 27, pp. 5778-5785 (2005)

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A novel generalized approach to phase-shifting interferometry in which phase distribution in an interferogram is evaluated in the presence of nonsinusoidal waveforms and piezoactuator device miscalibration is proposed. The approach is based on the underlying rotational invariance of signal subspaces spanned by two temporally displaced data sets. The advantage of the proposed method lies in its ability to identify arbitrary phase-step values pixelwise from an interference signal buried in noise. The robustness of the proposed method is investigated by addition of white Gaussian noise during the simulations.

© 2005 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

Original Manuscript: October 15, 2004
Revised Manuscript: February 24, 2005
Manuscript Accepted: March 21, 2005
Published: September 20, 2005

Abhijit Patil, Pramod Rastogi, and Benny Raphael, "Phase-shifting interferometry by a covariance-based method," Appl. Opt. 44, 5778-5785 (2005)

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